AFM-SPM Analyzer Skill | Agent Skills

AFM-SPM Analyzer

Purpose

The AFM-SPM Analyzer skill provides comprehensive atomic force and scanning probe microscopy data analysis for nanoscale surface characterization, including topography, mechanical properties, and electrical measurements.

Capabilities

Topography imaging and analysis
Surface roughness calculation (Ra, RMS)
Force-distance curve analysis
Nanoindentation and mechanical mapping
Kelvin probe force microscopy (KPFM)
Conductive AFM measurements

Usage Guidelines

AFM Analysis Workflow

Topography Analysis
- Apply plane leveling corrections
- Remove artifacts and noise
- Calculate roughness parameters
Mechanical Mapping
- Calibrate cantilever spring constant
- Apply contact mechanics models
- Generate modulus maps
Electrical Measurements
- Calibrate work function reference
- Map surface potential
- Measure local conductivity

Process Integration

Multi-Modal Nanomaterial Characterization Pipeline
In-Situ Characterization Experiment Design
Thin Film Deposition Process Optimization

Input Schema

{
  "data_file": "string",
  "analysis_type": "topography|force_curves|mechanical|electrical",
  "cantilever_specs": {
    "spring_constant": "number (N/m)",
    "tip_radius": "number (nm)"
  }
}

Output Schema

{
  "topography": {
    "Ra": "number (nm)",
    "RMS": "number (nm)",
    "Rmax": "number (nm)",
    "image_path": "string"
  },
  "mechanical": {
    "modulus": "number (GPa)",
    "adhesion": "number (nN)",
    "deformation": "number (nm)"
  },
  "electrical": {
    "surface_potential": "number (mV)",
    "work_function": "number (eV)"
  }
}

Agent Skills: AFM-SPM Analyzer

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