ToF-SIMS Analyzer Skill

ToF-SIMS Analyzer

Purpose

The ToF-SIMS Analyzer skill provides molecular-level surface analysis capabilities for nanomaterials, enabling identification of surface species, chemical imaging, and depth profiling with high sensitivity.

Capabilities

Molecular ion identification
Surface contamination analysis
2D and 3D chemical imaging
Isotope labeling detection
Depth profiling
Principal component analysis of spectra

Usage Guidelines

ToF-SIMS Analysis

Spectral Analysis
- Identify characteristic fragments
- Build peak lists for materials
- Apply multivariate analysis
Imaging Mode
- Optimize spatial resolution
- Generate chemical maps
- Correlate with topography
Depth Profiling
- Select appropriate sputter source
- Monitor interface sharpness
- Account for matrix effects

Process Integration

Multi-Modal Nanomaterial Characterization Pipeline
Nanomaterial Surface Functionalization Pipeline

Input Schema

{
  "sample_id": "string",
  "analysis_mode": "spectral|imaging|depth_profile",
  "primary_ion": "Bi3+|Bi1+|C60+",
  "polarity": "positive|negative",
  "area_of_interest": {"x": "number", "y": "number"}
}

Output Schema

{
  "identified_species": [{
    "mass": "number (amu)",
    "assignment": "string",
    "intensity": "number"
  }],
  "chemical_maps": [{
    "species": "string",
    "image_path": "string"
  }],
  "pca_results": {
    "principal_components": "number",
    "variance_explained": ["number"]
  }
}

Agent Skills: ToF-SIMS Analyzer

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